Optical excitations in electron microscopy
F. J. Garcia de Abajo

TL;DR
This review explores how electron microscopy techniques can probe optical excitations like plasmons in nanostructures with high spatial resolution, combining quantum and classical models to interpret experimental results.
Contribution
It provides a comprehensive comparison of quantum-mechanical and classical dielectric approaches for analyzing electron-induced optical excitations in nanostructures.
Findings
Electron microscopy can resolve plasmon modes with nanometer precision.
Classical dielectric models are effective for complex systems.
Electron energy-loss and cathodoluminescence spectroscopies reveal detailed plasmon information.
Abstract
This review discusses how low-energy, valence excitations created by swift electrons can render information on the optical response of structured materials with unmatched spatial resolution. Electron microscopes are capable of focusing electron beams on sub-nanometer spots and probing the target response either by analyzing electron energy losses or by detecting emitted radiation. Theoretical frameworks suited to calculate the probability of energy loss and light emission (cathodoluminescence) are revisited and compared with experimental results. More precisely, a quantum-mechanical description of the interaction between the electrons and the sample is discussed, followed by a powerful classical dielectric approach that can be in practice applied to more complex systems. We assess the conditions under which classical and quantum-mechanical formulations are equivalent. The excitation of…
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