Depth-dependent critical behavior in V2H
Charo I. Del Genio, Johann Trenkler, Kevin E. Bassler, Peter Wochner,, Dean R. Haeffner, George F. Reiter, Jianming Bai, Simon C. Moss

TL;DR
This study investigates how inhomogeneous defect distributions in V2H's surface layer cause a depth-dependent phase transition, revealing a novel critical behavior influenced by defect density variations.
Contribution
It introduces a depth-dependent scaling law to describe critical behavior in a defective surface layer with inhomogeneous dislocation distribution.
Findings
Critical temperature varies with depth due to defect density.
A new depth-dependent scaling law models the critical behavior.
Dislocation walls influence phase transition properties.
Abstract
Using X-ray diffuse scattering, we investigate the critical behavior of an order-disorder phase transition in a defective "skin-layer" of V2H. In the skin-layer, there exist walls of dislocation lines oriented normal to the surface. The density of dislocation lines within a wall decreases continuously with depth. We find that, because of this inhomogeneous distribution of defects, the transition effectively occurs at a depth-dependent local critical temperature. A depth-dependent scaling law is proposed to describe the corresponding critical ordering behavior.
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