Limit on the Addressability of Fault-Tolerant Nanowire Decoders
Yeow Meng Chee, Alan C. H. Ling

TL;DR
This paper establishes asymptotically tight bounds on the maximum number of nanowires addressable by mesowires in fault-tolerant nanowire decoders, considering fabrication errors, and links the problem to coding theory and combinatorial designs.
Contribution
It provides the first asymptotically tight bounds on addressability in fault-tolerant nanowire decoders, connecting the problem to coding theory and improving existing bounds.
Findings
N(m,e) = Θ(2^m / m^{e+1/2}) asymptotic bound
Established equivalence with optimal EC/AUED codes and combinatorial designs
Improved bounds over previous results in coding theory literature
Abstract
Although prone to fabrication error, the nanowire crossbar is a promising candidate component for next generation nanometer-scale circuits. In the nanowire crossbar architecture, nanowires are addressed by controlling voltages on the mesowires. For area efficiency, we are interested in the maximum number of nanowires that can be addressed by mesowires, in the face of up to fabrication errors. Asymptotically tight bounds on are established in this paper. In particular, it is shown that . Interesting observations are made on the equivalence between this problem and the problem of constructing optimal EC/AUED codes, superimposed distance codes, pooling designs, and diffbounded set systems. Results in this paper also improve upon those in the EC/AUEC codes literature.
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