Occupation times via Bessel functions
Yevgeniy Kovchegov, Nick Meredith, Eyal Nir

TL;DR
This paper derives explicit formulas for occupation time densities in continuous-time Markov processes, using Fourier, Laplace transforms, and Bessel functions, with applications to molecular state fluctuation analysis.
Contribution
It introduces a novel method combining Fourier and Laplace transforms to compute occupation time densities for Markov processes with countably many states, including explicit formulas involving Bessel functions.
Findings
Derived explicit occupation time density for simple random walk on Z
Connected occupation times to modified Bessel functions via spectral measures
Provided analytical tools for studying state occupation in Markov processes
Abstract
This study of occupation time densities for continuous-time Markov processes was inspired by the work of E.Nir et al (2006) in the field of Single Molecule FRET spectroscopy. There, a single molecule fluctuates between two or more states, and the experimental observable depends on the state's occupation time distribution. To mathematically describe the observable there was a need to calculate a single state occupation time distribution. In this paper, we consider a Markov process with countably many states. In order to find a one-stete occupation time density, we use a combination of Fourier and Laplace transforms in the way that allows for inversion of the Fourier transform. We derive an explicit expression for an occupation time density in the case of a simple continuous time random walk on Z. Also we examine the spectral measures in Karlin-McGregor diagonalization in an attempt to…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsMolecular Junctions and Nanostructures · Force Microscopy Techniques and Applications · Advanced Electron Microscopy Techniques and Applications
