Measurement of the shot noise in a single electron transistor

TL;DR

This paper reports on precise measurements of shot noise in a single electron transistor at microwave frequencies, revealing how Coulomb blockade influences noise characteristics and confirming theoretical predictions.

Contribution

The study introduces a method to measure shot noise in a SET at resonance frequency, providing experimental validation of the Fano factor variation with Coulomb blockade.

Findings

Fano factor varies between 0.5 and 1

Shot noise measurements agree with theoretical models

Resonance circuit enables noise measurement at 464 MHz

Abstract

We have systematically measured the shot noise in a single electron transistor (SET) as a function of bias and gate voltages. By embedding a SET in a resonance circuit we have been able to measure its shot noise at the resonance frequency 464 MHz, where the 1/f noise is negligible. We can extract the Fano factor which varies between 0.5 and 1 depending on the amount of Coulomb blockade in the SET, in very good agreement with the theory.