Interlayer exchange coupling in Co2FeAl0.5Si0.5/Cr/Co2FeAl0.5Si0.5 trilayers
T. Furubayashi, K. Kodama, H. S. Goripati, Y. K. Takahashi, K., Inomata, and K. Hono
TL;DR
This study investigates interlayer exchange coupling in Co2FeAl0.5Si0.5/Cr/Co2FeAl0.5Si0.5 trilayers, revealing structure-dependent magnetic interactions on different substrates, with implications for spintronic device design.
Contribution
It provides detailed analysis of how substrate-induced structure affects interlayer exchange coupling in CFAS/Cr/CFAS trilayers.
Findings
Strong exchange coupling observed at 1.5 nm Cr thickness
90-degree coupling in epitaxial films on MgO
Antiparallel coupling in polycrystalline films on SiO2
Abstract
Interlayer exchange couplings were examined for Co2FeAl0.5Si0.5(CFAS)/Cr/CFAS trilayered films grown on MgO (001) single crystal and thermally oxidized Si substrates. The films were (001) epitaxial on MgO and (110) textured polycrystalline on SiO2. Strong exchange couplings were observed for the films with the 1.5 nm thick Cr spacer layer. A 90 degree coupling is dominant in the (001) epitaxial film. In contrast, an antiparallel coupling exists in the polycrystalline one. The relationship of interlayer couplings with the structure is discussed.
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