A wavelet analysis of the Rosenblatt process: chaos expansion and estimation of the self-similarity parameter
Jean-Marc Bardet (SAMM), Ciprian Tudor (SAMM, LPP)

TL;DR
This paper employs chaos expansion and wavelet analysis to study the Rosenblatt process, deriving limit theorems and estimators for its self-similarity parameter, with applications demonstrated through simulations.
Contribution
It introduces a novel wavelet-based approach using chaos expansion for analyzing the Rosenblatt process and estimating its self-similarity index.
Findings
The wavelet coefficient statistic satisfies a non-central limit theorem for the Rosenblatt process.
Limit theorems enable the construction of consistent estimators for the self-similarity parameter.
Simulations illustrate the effectiveness of the proposed estimation method.
Abstract
By using chaos expansion into multiple stochastic integrals, we make a wavelet analysis of two self-similar stochastic processes: the fractional Brownian motion and the Rosenblatt process. We study the asymptotic behavior of the statistic based on the wavelet coefficients of these processes. Basically, when applied to a non-Gaussian process (such as the Rosenblatt process) this statistic satisfies a non-central limit theorem even when we increase the number of vanishing moments of the wavelet function. We apply our limit theorems to construct estimators for the self-similarity index and we illustrate our results by simulations.
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