On the Origin of the 2DEG Carrier Density at the LaAlO$_3$/SrTiO$_3$ Interface
Zoran S. Popovi\'c, Sashi Satpathy, Richard M. Martin

TL;DR
This study investigates the discrepancy between expected and observed carrier densities at the LaAlO$_3$/SrTiO$_3$ interface by using density-functional calculations to analyze electron subbands and their transport contributions.
Contribution
The paper provides a detailed density-functional analysis revealing multiple electron subbands and their roles, explaining the lower-than-expected carrier density at the interface.
Findings
Electrons occupy multiple subbands at the interface.
Some electrons are localized within a single layer.
Others are extended and contribute to transport.
Abstract
Transport measurements of the two-dimensional electron gas (2DEG) at the LaAlO/SrTiO interface have found a density of carriers much lower than expected from the "polar catastrophe" arguments. From a detail density-functional study, we suggest how this discrepancy may be reconciled. We find that electrons occupy multiple subbands at the interface leading to a rich array of transport properties. Some electrons are confined to a single interfacial layer and susceptible to localization, while others with small masses and extended over several layers are expected to contribute to transport.
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Taxonomy
TopicsElectronic and Structural Properties of Oxides · Semiconductor materials and devices · Advancements in Solid Oxide Fuel Cells
