Comparison of Resonant Inelastic X-Ray Scattering Spectra and Dielectric Loss Functions in Copper Oxides

TL;DR

This paper empirically compares RIXS spectra and dielectric loss functions in various copper oxides, revealing strong agreement and providing insights into their electronic excitations.

Contribution

It presents a direct comparison between RIXS spectra and optical dielectric loss functions in copper oxides, highlighting their correspondence and extracting an incident-energy-independent response.

Findings

Good agreement between RIXS and dielectric loss functions in Bi2CuO4 and CuGeO3.

Extraction of an incident-energy-independent response function.

Enhanced understanding of electronic excitations in copper oxides.

Abstract

We report empirical comparisons of Cu K-edge indirect resonant inelastic x-ray scattering (RIXS) spectra, taken at the Brillouin zone center, with optical dielectric loss functions measured in a number of copper oxides. The RIXS data are obtained for Bi$_2$CuO$_4$, CuGeO$_3$, Sr$_2$Cu$_3$O$_4$Cl$_2$, La$_2$CuO$_4$, and Sr$_2$CuO$_2$Cl$_2$, and analyzed by considering both incident and scattered photon resonances. An incident-energy-independent response function is then extracted. The dielectric loss functions, measured with spectroscopic ellipsometry, agree well with this RIXS response, especially in Bi$_2$CuO$_4$ and CuGeO$_3$.