Improved "Position Squared" Readout of a Mechanical Resonator in an Optical Cavity Using Degenerate Optical Modes
Jack C. Sankey, Andrew M. Jayich, Benjamin M. Zwickl, Cheng Yang, Jack, G. E. Harris

TL;DR
This paper enhances the sensitivity of position squared ($x^2$) measurements in optomechanical systems by using nearly degenerate optical modes, enabling better quantum state detection of a mechanical resonator.
Contribution
It introduces a method to significantly improve $x^2$ readout sensitivity by employing nearly degenerate transverse cavity modes and provides a theoretical framework for tunable $x^2$-coupling.
Findings
Achieved orders of magnitude improvement in $x^2$ sensitivity.
Derived a perturbation theory matching experimental results.
Theoretically demonstrated tunability of $x^2$-coupling.
Abstract
Optomechanical devices in which a flexible SiN membrane is placed inside an optical cavity allow for very high finesse and mechanical quality factor in a single device. They also provide fundamentally new functionality: the cavity detuning can be a quadratic function of membrane position. This enables a measurement of "position squared" () and in principle a QND phonon number readout of the membrane. However, the readout achieved using a single transverse cavity mode is not sensitive enough to observe quantum jumps between phonon Fock states. Here we demonstrate an -sensitivity that is orders of magnitude stronger using two transverse cavity modes that are nearly degenerate. We derive a first-order perturbation theory to describe the interactions between nearly-degenerate cavity modes and achieve good agreement with our measurements using realistic parameters. We also…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsMechanical and Optical Resonators · Force Microscopy Techniques and Applications · Advanced MEMS and NEMS Technologies
