Scaling behaviors of RESET voltages and currents in unipolar resistance switching

TL;DR

This paper investigates the scaling behaviors of RESET voltages and currents in unipolar resistance switching, revealing how these parameters depend on resistance and filament connectivity, with implications for device reliability.

Contribution

It introduces a scaling analysis of RESET voltages and currents in NiO capacitors, linking their behavior to percolation theory and filament connectivity.

Findings

RESET voltages and currents scale with resistance Ro in the low resistance state.

Scaling exponents change at Ro = 30 Ohm, indicating different regimes.

Connectivity of conducting filaments influences the RESET process.

Abstract

Unipolar switching phenomena have attracted a great deal of recent attention, but the wide distributions of switching voltages still pose major obstacles for scientific advancement and practical applications. Using NiO capacitors, we investigated the distributions of the RESET voltage and current. We found that they scaled with the resistance value Ro in the low resistance state, and that the scaling exponents varied at Ro = 30 Ohm. We explain these intriguing scaling behaviors and their crossovers by analogy with percolation theory. We show that the connectivity of conducting filaments plays a crucial role in the RESET process.