Tunnel transport through multiple junctions
J. Peralta-Ramos, and A. M. Llois

TL;DR
This paper investigates electron transport through multi-layered junctions, revealing oscillatory conductance behavior and significant enhancements at certain layer thicknesses, using Green's function formalism and tight-binding models.
Contribution
It introduces a detailed analysis of conductance oscillations and enhancement in double and triple junctions, extending understanding beyond simple junctions.
Findings
Conductance decays exponentially in simple junctions with semiconductor thickness.
Double and triple junctions exhibit conductance oscillations with metal layer thickness.
Maximum conductance enhancement reaches up to 323% in triple junctions.
Abstract
We calculate the conductance through double junctions of the type M(inf.)-Sn-Mm-Sn-M(inf.) and triple junctions of the type M(inf.)-Sn-Mm-Sn-Mm-Sn-M(inf.), where M(inf.) are semi-infinite metallic electrodes, Sn are 'n' layers of semiconductor and Mm are 'm' layers of metal (the same as the electrodes), and compare the results with the conductance through simple junctions of the type M(inf.)-Sn-M(inf.). The junctions are bi-dimensional and their parts (electrodes and 'active region') are periodic in the direction perpendicular to the transport direction. To calculate the conductance we use the Green's Functions Landauer-Bttiker formalism. The electronic structure of the junction is modeled by a tight binding Hamiltonian. For a simple junction we find that the conductance decays exponentially with semiconductor thickness. For double and triple junctions, the conductance…
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Taxonomy
TopicsRailway Systems and Energy Efficiency
