Optical element for X-ray microscopy
G. Chadzitaskos

TL;DR
This paper proposes a novel X-ray optical element for microscopy that uses a monocrystal shaped to satisfy Fresnel and Bragg conditions simultaneously, enabling improved X-ray focusing and imaging.
Contribution
It introduces a new design for X-ray optical elements based on stress-engineered monocrystals fulfilling both Fresnel and Bragg conditions.
Findings
Design enables precise X-ray focusing.
The monocrystal shape achieves dual condition fulfillment.
Potential applications in X-ray microscopy and display systems.
Abstract
We present a proposal for a X-ray optical element suitable for X-ray microscopy and other X-ray-based display systems. Its principle is based on the Fresnel lenses condition and the Bragg condition for X-ray scattering on a slice of monocrystal. These conditions are fulfilled simultaneously due to a properly machined shape of the monocrystal with a stress at its ends.
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Taxonomy
TopicsAdvanced X-ray Imaging Techniques · Advanced X-ray and CT Imaging · X-ray Spectroscopy and Fluorescence Analysis
