Tuning flux-pinning in epitaxial NdBa2Cu3O7-x films via engineered, hybrid nanoscale defect structures

TL;DR

This paper demonstrates how engineering hybrid nanoscale defect structures in epitaxial NdBa2Cu3O7-x films can effectively tune flux-pinning properties, leading to more isotropic critical current densities at 77 K and 1 T.

Contribution

It introduces a novel hybrid defect structure in NdBa2Cu3O7-x films and shows how this engineering can optimize flux-pinning and critical current density.

Findings

Reduced angular variation of Jc at 77 K, 1 T

Successful fabrication of hybrid defect structures

Enhanced flux-pinning performance

Abstract

Epitaxial NdBa2Cu3O7-x films with a hybrid nanoscale defect structure comprised of BaZrO3 nanodot arrays aligned along the c-axis in one half of the film thickness and aligned perpendicular to the c-axis in the other half thickness of the film were fabricated. Transmission electron microscopy images confirm the orientation of the nanoscale defect structures. The angular dependence of critical current density, Jc, at 77 K, 1 T, shows significantly reduced angular variation of Jc. This study nicely demonstrates how pinning characteristics can be tuned by tuning the nanoscale defect structures within the films.