Extreme Value Statistics in Silicon Photonics
David Borlaug, Bahram Jalali
TL;DR
This paper demonstrates that Raman amplified pulse fluctuations in silicon photonics follow extreme value statistics, providing mathematical understanding of this phenomenon in the context of noisy pump conditions.
Contribution
It introduces the application of extreme value statistics to analyze fluctuations in silicon photonics, offering new mathematical insights into their origin.
Findings
Fluctuations follow extreme value distributions
Mathematical analysis explains the origin of fluctuations
Implications for noise management in photonic systems
Abstract
We show that fluctuations of Raman amplified pulses, in the presence of a noisy pump, follow extreme value statistics, and provide mathematical insight into the origin of this perplexing behavior.
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Taxonomy
TopicsLaser-Matter Interactions and Applications · Optical Network Technologies · Neural Networks and Reservoir Computing