Easily testable logical networks based on a 'widened long flip-flop'

TL;DR

This paper introduces a novel approach to testing complex digital systems by using limited connections in logical networks, addressing testing complexity, tester testing, and defect masking issues.

Contribution

It proposes a new method based on limitations in logical gate connections to improve testability of digital networks with multiple stuck-at faults.

Findings

Reduces testing complexity for complex digital equipment

Enhances detection of multiple stuck-at faults

Addresses defect masking problems effectively

Abstract

The article describes an attempt to solve at once three basic problems arising at testing a complex digital equipment for defects: 1) the problem of an exponential increasing of the complexity of testing the equipment with the complexity of the equipment; 2) the problem of testing of the tester; 3) the problem of a mutual masking of defects. The proposed solution is nothing more than using certain limitations for connections between usual logical gates. Arbitrary multiple stuck-at-faults are supposed as defects.