Coulomb Drag in the Exciton Regime in Electron-Hole Bilayers
J. A. Seamons, C. P. Morath, J. L. Reno, M. P. Lilly

TL;DR
This study investigates Coulomb drag in electron-hole bilayers with varying barrier thicknesses, revealing signs of exciton formation and strong interlayer coupling as the barrier narrows, which could lead to exciton condensation.
Contribution
It provides experimental evidence of transition from weakly coupled to strongly coupled exciton regimes in electron-hole bilayers by measuring Coulomb drag at different barrier thicknesses.
Findings
Drag decreases with temperature at 30 nm barrier, indicating weak coupling.
Drag increases with decreasing temperature at 20 nm barrier, indicating strong coupling.
Results suggest onset of exciton formation and potential exciton condensation phenomena.
Abstract
We report electrical transport measurements on GaAs/AlGaAs based electron-hole bilayers. These systems are expected to make a transition from a pair of weakly coupled two-dimensional systems to a strongly coupled exciton system as the barrier between the layers is reduced. Once excitons form, phenomena such as Bose-Einstein condensation of excitons could be observed. In our devices, electrons and holes are confined in double quantum wells, and carriers in the devices are induced with top and bottom gates leading to variable density in each layer. Separate contact to each layer allows Coulomb drag transport measurements where current is driven in one layer while voltage is measured in the other. Coulomb drag is sensitive to interlayer coupling and has been predicted to provide a strong signature of exciton condensation. Drag measurement on EHBLs with a 30 nm barrier are consistent with…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
