Spin-dependent scattering in a silicon transistor
Rogerio de Sousa, Cheuk Chi Lo, Jeffrey Bokor

TL;DR
This paper develops a theory of spin-dependent scattering in silicon transistors, revealing how donor spin resonance affects current and proposing methods to optimize single-spin detection using EDMR.
Contribution
The paper introduces a detailed model of spin-dependent scattering in silicon transistors and demonstrates how to optimize EDMR signals for single-spin readout.
Findings
EDMR signal is maximized when donors are placed in a specific depth 'sweet spot'.
The EDMR amplitude depends on conduction electron spin polarization, increasing quadratically then saturating.
The theory enables using EDMR as an in-situ probe of spin polarization in silicon.
Abstract
The scattering of conduction electrons off neutral donors depends sensitively on the relative orientation of their spin states. We present a theory of spin-dependent scattering in the two dimensional electron gas (2DEG) of field effect transistors. Our theory shows that the scattering mechanism is dominated by virtual transitions to negatively ionized donor levels. This effect translates into a source-drain current that always gets reduced when donor spins are at resonance with a strong microwave field. We propose a model for donor impurities interacting with conduction electrons in a silicon transistor, and compare our explicit numerical calculations to electrically detected magnetic resonance (EDMR) experiments. Remarkably, we show that EDMR is optimal for donors placed into a sweet spot located at a narrow depth window quite far from the 2DEG interface. This allows significant…
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