Subwavelength microscope that uses frequency scanning for image reconstruction

TL;DR

This paper introduces a subwavelength imaging method using frequency scanning to reconstruct the external field profile with minimal measurements, enabling a no-moving-parts near-field microscope.

Contribution

It presents a novel frequency scanning technique for subwavelength imaging that allows field reconstruction with only a few measurements and no moving parts.

Findings

Reconstruction of the external field profile is possible with measurements at one or two points.

The method does not require moving parts, simplifying the microscope design.

Frequency scanning over the resonant modes enables detailed near-field imaging.

Abstract

A new principle of subwavelength imaging based on frequency scanning is considered. It is shown that it is possible to reconstruct the spatial profile of an external field exciting an array (or coupled arrays) of subwavelength-sized resonant particles with a frequency scan over the whole band of resonating array modes. During the scan it is enough to measure and store the values of the near field at one or at most two points. After the scan the distribution of the near field can be reconstructed with simple post-processing. The proposed near-field microscope has no moving parts.