Total internal reflection of evanescent plane waves
Akhlesh Lakhtakia (Pennsylvania State University), Tom G. Mackay, (University of Edinburgh)

TL;DR
This paper explores total internal reflection phenomena, demonstrating that both propagating and evanescent plane waves can undergo total internal reflection at dielectric interfaces, with the refracting medium needing to be optically denser.
Contribution
It introduces the concept that evanescent plane waves can also be totally internally reflected, expanding the understanding of wave behavior at dielectric interfaces.
Findings
Evanescent plane waves can be totally internally reflected.
Total internal reflection requires the refracting medium to be optically denser.
Reflection coefficient magnitude is unity for total internal reflection.
Abstract
Describing the phenomenon of total internal reflection in terms of a reflection coefficient of unit magnitude, we found that, not only can propagating plane waves be total internally reflected at the planar interface of two dissimilar, homogeneous, isotropic dielectric-magnetic mediums, but evanescent plane waves can also be. The refracting medium must be the optically denser of the two mediums for total internal reflection of an evanescent plane wave to occur.
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