Remote hole-doping of Mott insulators on the nanometer scale
M. Takizawa, Y. Hotta, T. Susaki, Y. Ishida, H. Wadati, Y. Takata, K., Horiba, M. Matsunami, S. Shin, M. Yabashi, K. Tamasaku, N. Nishino, T., Ishikawa, A. Fujimori, H. Y. Hwang

TL;DR
This study demonstrates remote hole-doping in transition metal oxide heterostructures through interface engineering, revealing a new method to control electronic properties without polar discontinuity.
Contribution
It introduces a novel approach for hole-doping transition metal oxides at interfaces using only polar layers, bypassing the need for polar discontinuity.
Findings
Vanadium valence shifts from V3+ to higher oxidation states with thinner LaAlO3 layers.
Hole-doping achieved without polar discontinuity.
High-resolution spectroscopy confirms electronic reconstruction.
Abstract
At interfaces between polar and nonpolar perovskite oxides, an unusual electron-doping has been previously observed, due to electronic reconstructions. We report on remote hole-doping at an interface composed of only polar layers, revealed by high-resolution hard x-ray core-level photoemission spectroscopy. In LaAlO3/LaVO3/LaAlO3 trilayers, the vanadium valence systematically evolves from the bulk value of V3+ to higher oxidation states with decreasing LaAlO3 cap layer thickness. These results provide a synthetic approach to hole-doping transition metal oxide heterointerfaces without invoking a polar discontinuity.
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Taxonomy
TopicsElectronic and Structural Properties of Oxides · Magnetic and transport properties of perovskites and related materials · Advanced Condensed Matter Physics
