Modeling single- and multiple-electron resonances for electric-field-sensitive scanning probes

TL;DR

This paper introduces a modeling approach for analyzing electron resonances in electric-field-sensitive scanning probes, combining electrostatics and numerical methods, validated against analytical and experimental data.

Contribution

It presents a novel modeling method that accurately analyzes single- and multiple-electron resonances in scanning probe techniques using boundary-element methods.

Findings

Model aligns well with analytical expressions

Model agrees with experimental data

Effective for analyzing electron resonances

Abstract

We have developed a modeling method suitable to analyze single- and multiple-electron resonances detected by electric-field-sensitive scanning probe techniques. The method is based on basic electrostatics and a numerical boundary-element approach. The results compare well to approximate analytical expressions and experimental data.