Broadband method for precise microwave spectroscopy of superconducting thin films near the critical temperature
H. Kitano, T. Ohashi, A. Maeda

TL;DR
This paper introduces a broadband microwave spectrometer capable of high-resolution measurements of complex conductivity in superconducting thin films near their critical temperature, overcoming calibration challenges caused by superconducting fluctuations.
Contribution
The paper presents a novel calibration method using the normal-state conductivity as a standard, enabling accurate broadband measurements near the superconducting transition.
Findings
Successful measurement of complex conductivity from 0.1 GHz to 10 GHz.
Effective calibration method for superconducting fluctuations.
Demonstrated applicability on various superconducting thin films.
Abstract
We present a high-resolution microwave spectrometer to measure the frequency-dependent complex conductivity of a superconducting thin film near the critical temperature. The instrument is based on a broadband measurement of the complex reflection coefficient, , of a coaxial transmission line, which is terminated to a thin film sample with the electrodes in a Corbino disk shape. In the vicinity of the critical temperature, the standard calibration technique using three known standards fails to extract the strong frequency dependence of the complex conductivity induced by the superconducting fluctuations. This is because a small unexpected difference between the phase parts of for a short and load standards gives rise to a large error in the detailed frequency dependence of the complex conductivity near the superconducting transition. We demonstrate that a new…
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