Atomic multiplet calculation of 3d_{5/2} -> 4f resonant x-ray diffraction from Ho metal
M. W. Haverkort, C. Sch\"u{\ss}ler-Langeheine, C. F. Chang, M., Buchholz, H.-H. Wu, H. Ott, E. Schierle, D. Schmitz, A. Tanaka, L. H., Tjeng

TL;DR
This paper demonstrates that atomic multiplet calculations can accurately reproduce resonant soft x-ray diffraction spectra of Ho metal at the $3d_{5/2} o 4f$ resonance, validating this approach for analyzing correlated electron systems.
Contribution
It introduces a successful application of atomic multiplet calculations to interpret resonant x-ray diffraction data from Ho metal, showing good agreement with experiments.
Findings
Atomic multiplet calculations match experimental spectra.
Simulation effectively analyzes resonant soft x-ray diffraction.
Method is suitable for correlated electron systems.
Abstract
We compare for Ho metal the x-ray absorption spectrum and the resonant soft x-ray diffraction spectra obtained at the () resonance for the magnetic 1st and 2nd order diffraction peaks and with the result of an atomic multiplet calculation. We find a good agreement between experiment and simulation giving evidence that this kind of simulation is well suited to quantitatively analyze resonant soft x-ray diffraction data from correlated electron systems.
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Taxonomy
TopicsRare-earth and actinide compounds · X-ray Diffraction in Crystallography · Crystallography and Radiation Phenomena
