Migration volume for polaron dielectric relaxation in disordered materials

TL;DR

This paper presents a theoretical analysis of how pressure affects polaron-related dielectric relaxation in disordered materials, linking migration volume to polaron dynamics and experimental observations.

Contribution

It introduces a formulation to determine migration volume and relates it to polaron behavior, supported by analysis of experimental dielectric loss data under pressure.

Findings

Migration volume sign indicates relaxation nature

Positive and negative migration volumes analyzed

Relation between migration volume and polaron distortion established

Abstract

A theoretical study of the influence of pressure on the dielectric relaxation related with polaron tunneling and phonon assisted hopping in disordered solids is developed. The sign and absolute value of the migration volume, which is obtained by employing the present formulation, evidence about the nature of the relaxation. As a paradigm, positive and negative values of migration volume are evaluated by analyzing recently published dielectric loss measurements under pressure in semiconducting polypyrrole. A straightforward relation between the value of the migration volume and the nature of short-range polaron flow and the size of polaron distortion is revealed.