Atomic data and electron-impact broadening effect in DO white dwarf atmospheres: Si VI

TL;DR

This paper calculates atomic data for five-times ionized silicon and assesses electron-impact broadening effects to understand spectral line profiles in DO white dwarf atmospheres.

Contribution

It provides new atomic data and impact broadening calculations for Si VI, incorporating relativistic and semi-empirical corrections, to improve spectral modeling of white dwarf atmospheres.

Findings

Calculated impact line widths and shifts for Si VI multiplets.

Assessed Stark broadening influence on white dwarf spectral lines.

Enhanced atomic data accuracy for astrophysical plasma modeling.

Abstract

Energy levels, electric dipole transition probabilities and oscillator strengths in five times ionized silicon have been calculated in intermediate coupling. The present calculations were carried out with the general purpose atomic-structure program SUPERSTRUCTURE. The relativistic corrections to the non-relativistic Hamiltonian are taken into account through the Breit-Pauli approximation. We have also introduced a semi-empirical correction (TEC) for the calculation of the energy-levels. These atomic data are used to provide semiclassical electron-, proton- and ionized helium- impact line widths and shifts for 15 Si VI muliplet. Calculated results have been used to consider the influence of Stark broadening for DO white dwarf atmospheric conditions.