Dielectric constant boost in amorphous sesquioxides
Pietro Delugas, Vincenzo Fiorentini, and Alessio Filippetti

TL;DR
This study demonstrates that amorphous ScO3 exhibits a significantly higher dielectric constant than its crystalline form, due to disorder-induced activation of low-frequency modes and preserved atomic polarizability, promising for microelectronics.
Contribution
It reveals that amorphization enhances dielectric properties in X2O3 sesquioxides through disorder effects and atomic charge conservation, supported by first-principles simulations.
Findings
Dielectric constant increases by over 40% in amorphous ScO3.
Disorder activates low-frequency cation modes.
Effective dynamical charges are conserved in amorphous phase.
Abstract
High-kappa dielectrics for insulating layers are a current key ingredient of microelectronics. X2O3 sesquioxide compounds are among the candidates. Here we show for a typical material of this class, ScO3, that the relatively modest dielectric constant of its crystalline phase is enhanced in the amorphous phase by over 40% (from ~15 to ~22). This is due to the disorder-induced activation of low frequency cation-related modes which are inactive or inefficient in the crystal, and by the conservation of effective dynamical charges (a measure of atomic polarizability). The analysis employs density-functional energy-force and perturbation-theory calculations of the dielectric response of amorphous samples generated by pair-potential molecular dynamics.
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