Silicon on Nothing Mems Electromechanical Resonator
C. Durand (ST-Crolles, Leti, Iemn), F. Casset (LETI), P. Ancey, (ST-Crolles), F. Judong (ST-Crolles), A. Talbot (ST-Crolles), R. Quenouillere, (LETI), D. Renaud (LETI), S. Borel (LETI), B. Florin (LETI), L. Buchaillot, (IEMN)

TL;DR
This paper discusses silicon MEMS electromechanical resonators for RF applications, highlighting their design, performance, environmental sensitivities, and recent developments at STMicroelectronics, aiming to replace traditional RF components with integrated, low-power solutions.
Contribution
It provides a comprehensive overview of silicon MEMS resonators, including design mechanisms, environmental effects, and recent technological advancements at STMicroelectronics.
Findings
Resonant frequency depends on material properties and structure dimensions.
Performance is sensitive to environmental factors like moisture and pressure.
Recent developments include FEM analysis and characterization at STMicroelectronics.
Abstract
The very significant growth of the wireless communication industry has spawned tremendous interest in the development of high performances radio frequencies (RF) components. Micro Electro Mechanical Systems (MEMS) are good candidates to allow reconfigurable RF functions such as filters, oscillators or antennas. This paper will focus on the MEMS electromechanical resonators which show interesting performances to replace SAW filters or quartz reference oscillators, allowing smaller integrated functions with lower power consumption. The resonant frequency depends on the material properties, such as Young's modulus and density, and on the movable mechanical structure dimensions (beam length defined by photolithography). Thus, it is possible to obtain multi frequencies resonators on a wafer. The resonator performance (frequency, quality factor) strongly depends on the environment, like…
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