X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism investigation of size effects on field-induced N\'eel-cap reversal

TL;DR

This study uses combined X-ray photoelectron emission microscopy and magnetic circular dichroism to examine how size influences the magnetic reversal of Nel caps in Fe(110) dots under an applied magnetic field.

Contribution

It demonstrates the application of combined microscopy techniques to investigate size effects on Nel-cap reversal in micron-sized magnetic dots.

Findings

Nel-cap reversal occurs around 120 mT with a 20 mT variation.

No correlation between dot size or shape and reversal field.

Magnetization reversal is consistent across different geometries.

Abstract

X-ray photoelectron emission microscopy in combination with x-ray magnetic circular dichroism is used to investigate the influence of an applied magnetic field on N\'eel caps (i.e., surface terminations of asymmetric Bloch walls). Self-assembled micron-sized Fe(110) dots displaying a moderate distribution of size and aspect ratios serve as model objects. Investigations of remanent states after application of an applied field along the direction of N\'eel-cap magnetization give clear evidence for the magnetization reversal of the N\'eel caps around 120 mT, with a $\pm$20 mT dispersion. No clear correlation could be found between the value of the reversal field and geometrical features of the dots.