Light Scattering on Random Dielectric Layers

TL;DR

This paper studies how light scattering, including band gaps and Anderson localization, depends on wavelength, randomness, and incident angle in a one-dimensional dielectric layer stack, revealing unique angular localization patterns.

Contribution

It provides new insights into the angular dependence of Anderson localization in random dielectric layers, highlighting differences with absorptive layers.

Findings

Localization length varies non-monotonously with incident angle.

Characteristic angular dependence observed near layer thickness wavelength.

Absorptive layers lack the angular dependence seen in localization.

Abstract

Scattering of light by a random stack of dielectric layers represents a one-dimensional scattering problem, where the scattered field is a three-dimensional vector field. We investigate the dependence of the scattering properties (band gaps and Anderson localization) on the wavelength, strength of randomness and relative angle of the incident wave. There is a characteristic angular dependence of Anderson localization for wavelengths close to the thickness of the layers. In particular, the localization length varies non-monotonously with the angle. In contrast to Anderson localization, absorptive layers do not have this characteristic angular dependence.