A planar multipole ion trap

TL;DR

This paper introduces a chip-based multipole ion trap fabricated with MEMS technology, enabling stable ion confinement with optical access, supported by an analytical model and experimental validation of argon ion trapping.

Contribution

It presents a novel MEMS-fabricated planar multipole ion trap with analytical modeling and experimental validation of ion confinement and lifetime.

Findings

Stable trapping of argon ions achieved

Ion lifetime measured at 16 seconds

Electrostatic charging effects analyzed

Abstract

We report on the realisation of a chip-based multipole ion trap manufactured using micro-electromechanical systems (MEMS) technology. It provides ion confinement in an almost field-free volume between two planes of radiofrequency electrodes, deposited on glass substrates, which allows for optical access to the trap. An analytical model of the effective trapping potential is presented and compared with numerical calculations. Stable trapping of argon ions is achieved and a lifetime of 16s is measured. Electrostatic charging of the chip surfaces is studied and found to agree with a numerical estimate.