Full Counting Statistics of Multiple Andreev Reflections in incoherent diffusive superconducting junctions

TL;DR

This paper develops a comprehensive theory for the full counting statistics of current fluctuations in incoherent diffusive superconducting junctions under voltage bias, covering all voltage regimes and extending previous work.

Contribution

It introduces a new theoretical framework for analyzing full counting statistics in incoherent diffusive superconducting junctions across arbitrary voltages.

Findings

Analysis of the first four cumulants of current fluctuations

Characterization of low and high voltage regimes

Extension of previous theoretical results

Abstract

We present a theory for the full distribution of current fluctuations in incoherent diffusive superconducting junctions, subjected to a voltage bias. This theory of full counting statistics of incoherent multiple Andreev reflections is valid for arbitrary applied voltage. We present a detailed discussion of the properties of the first four cumulants as well as the low and high voltage regimes of the full counting statistics. The work is an extension of the results of Pilgram and the author, Phys. Rev. Lett. 94, 086806 (2005).