Measurement of the charged kaon lifetime with the KLOE detector
F. Ambrosino, A. Antonelli, M. Antonelli, F. Archilli, C. Bacci, P., Beltrame, G. Bencivenni, S. Bertolucci, C. Bini, C. Bloise, S. Bocchetta, F., Bossi, P. Branchini, R. Caloi, P. Campana, G. Capon, T. Capussela, F., Ceradini, S. Chi, G. Chiefari, P. Ciambrone, E. De Lucia
TL;DR
This paper reports a precise measurement of the charged kaon lifetime using a large sample of tagged decays at the DAΦNE -factory, employing decay time and length distributions.
Contribution
The study provides a new, accurate measurement of the charged kaon lifetime using a novel tagging and analysis method at the DA -factory.
Findings
Measured = (12.347 b1 0.030) ns
Used 15 million tagged kaon decays
Achieved precise lifetime determination from decay distributions
Abstract
We have measured the charged kaon lifetime using a sample of 15 \times 10^6 tagged kaon decays. Charged kaons were produced in pairs at the DA\PhiNE \phi-factory, e^+e^- \to \phi \to K^+ K^-. The decay of a K^+ was tagged by the production of a K^- and viceversa. The lifetime was obtained, for both charges, from independent measurements of the decay time and decay lenght distributions. From fits to the four distributions we find \tau = (12.347\pm0.030) ns.
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