The epitaxial-graphene/graphene-oxide junction, an essential step towards epitaxial graphene electronics
Xiaosong Wu, Mike Sprinkle, Xuebin Li, Fan Ming, Claire Berger, Walt, A. de Heer

TL;DR
This paper demonstrates the creation of all-graphene electronic devices using graphene oxide as a bridge, revealing tunable Schottky barriers and high mobility comparable to silicon, advancing epitaxial graphene electronics.
Contribution
It introduces a method to fabricate all-graphene devices with tunable barriers using graphene oxide, including in situ local oxidation of epitaxial graphene.
Findings
Schottky barriers of about 0.7 eV at graphene/GO junctions
Barrier height reduces after annealing at 180°C
GO mobility exceeds 850 cm²/Vs, comparable to silicon
Abstract
Graphene oxide (GO) flakes have been deposited to bridge the gap between two epitaxial graphene electrodes to produce all-graphene devices. Electrical measurements indicate the presence of Schottky barriers (SB) at the graphene/graphene oxide junctions, as a consequence of the band-gap in GO. The barrier height is found to be about 0.7 eV, and is reduced after annealing at 180 C, implying that the gap can be tuned by changing the degree of oxidation. A lower limit of the GO mobility was found to be 850 cm/Vs, rivaling silicon. {\it In situ} local oxidation of patterned epitaxial graphene has been achieved.
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