Photodetection in silicon beyond the band edge with surface states
T. Baehr-Jones, M. Hochberg, A. Scherer

TL;DR
This paper demonstrates silicon-based photodetectors operating beyond the band edge by utilizing surface state absorption, achieving notable responsivity and speed suitable for integrated optical applications.
Contribution
It introduces a novel silicon photodetector leveraging surface states for photodetection at telecom wavelengths, with measurable responsivity and high-speed operation.
Findings
Responsivity of 36 mA/W achieved
Quantum efficiency of 2.8% demonstrated
Photodetectors operate up to 60 MHz speed
Abstract
Silicon is an extremely attractive material platform for integrated optics at telecommunications wavelengths, particularly for integration with CMOS circuits. Developing detectors and electrically pumped lasers at telecom wavelengths are the two main technological hurdles before silicon can become a comprehensive platform for integrated optics. We report on the generation of free carriers in unimplanted SOI ridge waveguides, which we attribute to surface state absorption. By electrically contacting the waveguides, a photodetector with a responsivity of 36 mA/W and quantum efficiency of 2.8% is demonstrated. The photoconductive effect is shown to have minimal falloff at speeds of up to 60 Mhz.
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