Band structure related wave function symmetry of amphoteric Si dopants in GaAs
S. Loth, M. Wenderoth, K. Teichmann, R. G. Ulbrich

TL;DR
This study uses high-resolution scanning tunneling spectroscopy to analyze the wave function symmetry of amphoteric silicon dopants in GaAs, revealing distinct electronic contrasts for donors and acceptors related to their wave function distributions.
Contribution
It provides detailed imaging of Si dopant states in GaAs, linking contrast features to wave function symmetry and tunneling processes at the valence band edge.
Findings
Si(Ga) donors show radially symmetric contrasts
Si(As) acceptors display anisotropic features
Contrast differences are related to wave function symmetry and tunneling
Abstract
Autocompensated Si-doped GaAs is studied with cross-sectional scanning tunneling spectroscopy (X-STS). The local electronic contrasts of substitutional Si(Ga) donors and Si(As) acceptors under the (110) cleavage plane are imaged with high resolution. Si(Ga) donor atoms exhibit radially symmetric contrasts. Si(As) acceptors have anisotropic features. The anisotropic acceptor contrasts are traced back to a tunnel process at the valence band edge. They reflect the probability density distribution of the localized acceptor hole state.
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