Realization of XNOR and NAND spin-wave logic gates

TL;DR

This paper demonstrates the implementation of XNOR and NAND logic gates using spin-wave interferometry in ferrite films, controlled by phase or amplitude modulation via current pulses, advancing magnonic logic device technology.

Contribution

It introduces a novel spin-wave interferometer design for XNOR and NAND gates with control via phase and amplitude modulation, showing practical magnonic logic gate realization.

Findings

Successful demonstration of spin-wave XNOR and NAND gates

Control of logic states through phase and amplitude modulation

Potential for scalable magnonic logic circuits

Abstract

We demonstrate the functionality of spin-wave logic XNOR and NAND gates based on a Mach-Zehnder type interferometer which has arms implemented as sections of ferrite film spin-wave waveguides. Logical input signals are applied to the gates by varying either the phase or the amplitude of the spin waves in the interferometer arms. This phase or amplitude variation is produced by Oersted fields of dc current pulses through conductors placed on the surface of the magnetic films.