Derivations of Normalized Mutual Information in Binary Classifications
Yong Wang, Bao-Gang Hu

TL;DR
This paper introduces normalized mutual information as a new, well-defined metric for evaluating binary classifiers, deriving its relationships with traditional performance measures like accuracy, precision, and recall.
Contribution
It provides closed-form relations between normalized mutual information and common classifier performance metrics, revealing its nonlinear dependence and potential for improved evaluation.
Findings
Normalized mutual information is a compact, well-defined evaluation metric.
Derived explicit relations between NI and accuracy, precision, recall.
Revealed NI as a set of nonlinear functions of traditional metrics.
Abstract
This correspondence studies the basic problem of classifications - how to evaluate different classifiers. Although the conventional performance indexes, such as accuracy, are commonly used in classifier selection or evaluation, information-based criteria, such as mutual information, are becoming popular in feature/model selections. In this work, we propose to assess classifiers in terms of normalized mutual information (NI), which is novel and well defined in a compact range for classifier evaluation. We derive close-form relations of normalized mutual information with respect to accuracy, precision, and recall in binary classifications. By exploring the relations among them, we reveal that NI is actually a set of nonlinear functions, with a concordant power-exponent form, to each performance index. The relations can also be expressed with respect to precision and recall, or to false…
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsNeural Networks and Applications · Face and Expression Recognition · Fuzzy Logic and Control Systems
