Contactless Thermal Characterization Method of PCB-s Using an IR Sensor Array
Gy. Bognar, V. Szekely, M. Rencz

TL;DR
This paper presents a novel contactless thermal characterization method for PCBs using an IR sensor array, enabling real-time temperature mapping of circuits in operational systems.
Contribution
It introduces a quasi real-time IR-based thermal characterization technique for PCBs, allowing in situ temperature monitoring without physical contact.
Findings
Feasibility demonstrated for IR-based PCB thermal mapping
Method enables quasi real-time temperature distribution monitoring
Suitable for in situ measurements among operating system components
Abstract
In this paper the feasibility study of an IR sensor card is presented. The methodology and the results of a quasi real-time thermal characterization tool and method for the temperature mapping of circuits and boards based on sensing the infrared radiation is introduced. With the proposed method the IR radiation-distribution of boards from the close proximity of the sensor card is monitored in quasi real-time. The proposed method is enabling in situ IR measurement among operating cards of a system e.g. in a rack.
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Taxonomy
TopicsElectronic Packaging and Soldering Technologies · Industrial Vision Systems and Defect Detection · 3D IC and TSV technologies
