Measurement Technique for Elastic and Mechanical Properties of Polycrystalline Silicon-Germanium Films Using Surface Acoustic Waves and Projection Masks
A. Bennis, C. Leinenbach, C. Raudzis, R. M\"uller-Fiedler, S., Kronm\"uller

TL;DR
This paper presents a novel method using surface acoustic waves and projection masks to accurately measure the elastic and mechanical properties of polycrystalline Silicon-Germanium films, demonstrating high agreement with traditional measurement techniques.
Contribution
It introduces a combined optical and acoustic measurement approach using BEM modeling and laser-generated SAWs for precise property determination of SiGe films.
Findings
Accurate measurement of Young's modulus, density, and thickness of SiGe films.
Excellent agreement with traditional measurement methods.
Effective use of narrowband laser scheme and projection masks for surface acoustic wave generation.
Abstract
Using Rayleigh surface acoustic waves (SAW), the Young's modulus, the density and the thickness of polycrystalline Silicon-Germanium (SiGe) films deposited on silicon and SiO2 were measured, in excellent agreement with theory. The dispersion curve of the propagating SAW is calculated with a Boundary Element Method (BEM)-Model based on Green's functions. The propagating SAW is generated with a nanosecond laser in a narrowband scheme projecting stripes from a mask on the surface of the sample. For this purpose a glass mask and a liquid crystal display (LCD) mask are used. The slope of the SAW is then measured using a probe beam setup. From the wavelength of the mask and the frequency of the measured SAW, the dispersion curve is determined point by point. Fitting the BEM-Model to the measured nonlinear dispersion curve provides several physical parameters simultaneously. In the present…
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Taxonomy
TopicsAcoustic Wave Resonator Technologies · Advanced MEMS and NEMS Technologies · Advanced Surface Polishing Techniques
