Impact on $\gamma\phi_3$ from CLEO-c Using CP-tagged $D\toK_{S,L}\pi\pi$ Decays

TL;DR

This paper discusses how CLEO-c's technique for constraining charm decay models impacts the precision measurement of the CKM angle gamma/phi_3 at B-factories, emphasizing the importance of charm Dalitz plot analyses.

Contribution

It introduces a method at CLEO-c to reduce model uncertainties in charm decays, improving gamma/phi_3 measurement accuracy.

Findings

CLEO-c technique constrains charm decay model uncertainties.

Impact on gamma/phi_3 measurement precision demonstrated.

Enhanced understanding of charm Dalitz plot analyses.

Abstract

Precision determination of the CKM angle $\gamma/\phi_3$ depends upon constraints on charm mixing amplitudes, measurements of doubly-Cabibbo suppressed amplitudes and relative phases, and studies of charm Dalitz plots tagged by flavor or CP eigenstates. In this note we describe the technique used at CLEO-c to constrain the $K_{S,L}\pi\pi$ model uncertainty, and its impact on $\gamma/\phi_3$ measurements at B-factories presented at the Charm 2007 Workshop.