Summary of SLAC'S SEY Measurement On Flat Accelerator Wall Materials

TL;DR

This paper summarizes measurements of secondary electron yield (SEY) on flat accelerator wall materials like TiN, TiZrV, and Al, highlighting how conditioning and particle exposure affect their electron cloud mitigation properties.

Contribution

It provides new laboratory data on SEY behavior of specific materials under various conditioning and exposure conditions for accelerator applications.

Findings

SEY decreases after thermal conditioning

SEY changes with low energy particle exposure

Material surface properties influence electron cloud formation

Abstract

The electron cloud effect (ECE) causes beam instabilities in accelerator structures with intense positively charged bunched beams. Reduction of the secondary electron yield (SEY) of the beam pipe inner wall is effective in controlling cloud formation. We summarize SEY results obtained from flat TiN, TiZrV and Al surfaces carried out in a laboratory environment. SEY was measured after thermal conditioning, as well as after low energy, less than 300 eV, particle exposure.