Suppression of rectification at metal-Mott-insulator interfaces
Kenji Yonemitsu, Nobuya Maeshima, and Tatsuo Hasegawa

TL;DR
This paper investigates charge transport at metal-Mott-insulator interfaces, revealing that rectification is suppressed due to the ambipolar nature of field-effect injections, contrasting with traditional band insulator interfaces.
Contribution
It provides a theoretical and experimental analysis showing suppression of rectification at metal-Mott-insulator interfaces, highlighting the role of ambipolar injection in this phenomenon.
Findings
Rectification is strongly suppressed at metal-Mott-insulator interfaces.
The suppression is linked to the ambipolar nature of charge injection.
Experimental results confirm the theoretical predictions.
Abstract
Charge transport through metal-Mott-insulator interfaces is studied and compared with that through metal-band-insulator interfaces. For band insulators, rectification has been known to occur owing to a Schottky barrier, which is produced by the work-function difference. For Mott insulators, however, qualitatively different current-voltage characteristics are obtained. Theoretically, we use the one-dimensional Hubbard model for a Mott insulator and attach to it the tight-binding model for metallic electrodes. A Schottky barrier is introduced by a solution to the Poisson equation with a simplified density-potential relation. The current density is calculated by solving the time-dependent Schr\"odinger equation. We mainly use the time-dependent Hartree-Fock approximation, and also use exact many-electron wave functions on small systems for comparison. Rectification is found to be strongly…
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