Josephson Current and Multiple Andreev Reflections in Graphene SNS Junctions

TL;DR

This study investigates Josephson current and multiple Andreev reflections in graphene-based SNS junctions, revealing that diffusive transport models better explain experimental results than ballistic models, due to short mean free paths.

Contribution

The paper demonstrates that diffusive transport models accurately describe graphene SNS junctions, challenging the expectation of ballistic behavior in such devices.

Findings

Diffusive model matches experimental data closely.

Mean free paths are much shorter than junction lengths.

All tested devices on SiO2 are in the diffusive regime.

Abstract

The Josephson Effect and Superconducting Proximity Effect were observed in Superconductor -Graphene-Superconductor (SGS) Josephson junctions with coherence lengths comparable to the distance between the superconducting leads. By comparing the measured temperature and doping dependence of the supercurrent and the proximity induced sub-gap features (multiple Andreev reflections) to theoretical predictions we find that, contrary to expectations, the ballistic transport model fails to describe the SGS junctions. In contrast, the diffusive junction model yields close quantitative agreement with the results. This conclusion is consistent with transport measurements in the normal state, which yield mean free paths in the graphene link that are much shorter than the junction length. We show that all devices fabricated on SiO2 substrates so far (our own as well as those reported by other groups) fall in the diffusive junction category.