A New Approach to Component Testing
Horst Brinkmeyer

TL;DR
This paper introduces a novel component testing method for automotive electronics that is stand-independent, enabling long-term knowledge accumulation and sharing among partners.
Contribution
It presents a new approach to component testing that is independent of test stands, facilitating knowledge sharing and long-term data collection.
Findings
Method is stand-independent, reducing dependency on specific test setups.
Enables long-term knowledge accumulation and sharing.
Potential to improve testing consistency and collaboration.
Abstract
Carefully tested electric/electronic components are a requirement for effective hardware-in-the-loop tests and vehicle tests in automotive industry. A new method for definition and execution of component tests is described. The most important advantage of this method is independance from the test stand. It therefore offers the oppportunity to build up knowledge over a long period of time and the ability to share this knowledge with different partners.
Peer Reviews
No public reviews on file for this paper yet. If you reviewed it on a platform where reviews are public (OpenReview, ICLR, NeurIPS, ICML), you can paste yours below so the community can read it here.
Videos
No videos yet. Explain this paper in a talk, walkthrough, or lecture? Add one.
Taxonomy
TopicsReal-time simulation and control systems · VLSI and Analog Circuit Testing · Electrostatic Discharge in Electronics
