Noise Figure Evaluation Using Low Cost BIST

TL;DR

This paper presents a low-cost built-in self-test (BIST) method for evaluating the noise figure of analog circuits, leveraging a simple digitizer and SoC resources for efficient, multi-point noise measurement.

Contribution

It introduces a novel, cost-effective BIST technique for noise figure evaluation that utilizes a single-bit digitizer and existing SoC resources, enabling simultaneous multi-point testing.

Findings

Feasibility demonstrated through theoretical analysis and experiments

Allows simultaneous noise figure evaluation at multiple test points

Utilizes low-cost digitizer and SoC resources effectively

Abstract

A technique for evaluating noise figure suitable for BIST implementation is described. It is based on a low cost single-bit digitizer, which allows the simultaneous evaluation of noise figure in several test points of the analog circuit. The method is also able to benefit from SoC resources, like memory and processing power. Theoretical background and experimental results are presented in order to demonstrate the feasibility of the approach.