New Schemes for Self-Testing RAM

TL;DR

This paper introduces pseudo-ring testing (PRT), a novel self-testing technique for various RAM types that emulates a linear automaton using memory components, enhancing testing capabilities.

Contribution

The paper presents a new PRT methodology that applies to diverse RAM architectures by emulating a linear automaton over Galois fields.

Findings

PRT can test wide types of RAMs including bit- and word-oriented

It emulates a linear automaton over Galois fields using memory components

The technique improves self-testing efficiency for RAMs

Abstract

This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing wide type of random access memories (RAM): bit- or word-oriented and single- or dual-port RAM's. An essential particularity of the proposed methodology is the emulation of a linear automaton over Galois field by memory own components.