Hysteresis Models of Dynamic Mode Atomic Force Microscopes: Analysis and Identification

TL;DR

This paper introduces hysteresis-based models for dynamic mode atomic force microscopes that capture dissipative effects and nonlinear behaviors, validated through experiments showing good agreement.

Contribution

The paper develops a novel hysteresis model framework for dynamic AFM, enabling better understanding and identification of tip-sample interactions.

Findings

Models accurately describe dissipative phenomena

Frequency domain analysis reveals nonlinear behaviors

Experimental validation confirms model effectiveness

Abstract

A new class of models based on hysteresis functions is developed to describe atomic force microscopes operating in dynamic mode. Such models are able to account for dissipative phenomena in the tip-sample interaction which are peculiar of this operation mode. The model analysis, which can be pursued using frequency domain techniques, provides a clear insight of specific nonlinear behaviours. Experiments show good agreement with the identified models.