Exact results for quench dynamics and defect production in a two-dimensional model
K. Sengupta, Diptiman Sen, Shreyoshi Mondal

TL;DR
This paper derives an exact scaling law for defect production during quenches across critical surfaces in d-dimensional models, exemplified by the 2D Kitaev model, and provides correlation function calculations for defect analysis.
Contribution
It introduces a general scaling law for defect density in quenched systems crossing critical surfaces and offers the first exact multispin correlation function calculations in a 2D model.
Findings
Defect density scales as 1/τ^{mν/(zν+1)} across critical surfaces.
Kitaev model exemplifies the scaling with d=2, m=ν=z=1.
Exact multispin correlation functions are computed for the 2D model.
Abstract
We show that for a d-dimensional model in which a quench with a rate \tau^{-1} takes the system across a d-m dimensional critical surface, the defect density scales as n \sim 1/\tau^{m\nu/(z\nu +1)}, where \nu and z are the correlation length and dynamical critical exponents characterizing the critical surface. We explicitly demonstrate that the Kitaev model provides an example of such a scaling with d=2 and m=\nu=z=1. We also provide the first example of an exact calculation of some multispin correlation functions for a two-dimensional model which can be used to determine the correlation between the defects. We suggest possible experiments to test our theory.
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