The method of non-linear distortions elimination in photoacoustic investigation of layered semiconductor structure

TL;DR

This paper addresses the impact of non-linear distortions in photoacoustic measurements of layered semiconductors and introduces a method to eliminate these distortions to improve thermal property analysis.

Contribution

The paper proposes a novel method to eliminate non-linear distortions in photoacoustic measurements of layered semiconductor structures.

Findings

The method effectively reduces non-linear distortions in measurements.

Improved accuracy in thermal property analysis of layered semiconductors.

Enhanced reliability of photoacoustic measurement results.

Abstract

This paper presents the consideration of the presence and the influence of non-linear distortion of photo-acoustic measurement set-up on the results of thermal properties analysis for the multi-layer semiconductor structure. The authors propose a method which will eliminate such an influence.